CCS5.3中针对TMDSEVM6670LE设置target configuration的步骤

来源：互联网发布：重庆时时彩开奖源码编辑：程序博客网时间：2024/05/27 01:15

转载地址：http://www.chengkaiblog.com/technology/ccs-arget-configuration-setting-steps/

在本文中将详细介绍如何在Code Composer Studio (CCS)中设置target configuration。

环境：

开发板：TMDSEVM6670LE

模拟器：XDS560v2 Emulator

电源：自带电源

步骤：

Step1：在CCS 5.3中将界面切换到CCS Debug，这个按钮在软件界面的右上角。如果没有，请点击”CCS Edit”左边的添加按钮，将CCS Debug加上去。按钮如下图所示。

Step2：点击当前界面左下角的按钮，如下图所示。弹出的界面如下图所示
Step3：在该界面单击右键，并选择New Target Configuration，如下图所示。
Step4：输入名字，还可以设置文件的存放位置（在本文中没有修改存放位置），最后单击Finish。如下图所示。
Step5：在Connection中选择Blackhawk XDS5560v2-USB System Trace Emulator，在Board or Device后面输入过滤文字C6670（因为我的开发板上的DSP芯片是C6670），之后在下面TMS320C6670前面的复选框上打上√，单击Save和Test Connection。（注意：在单击Test Connection之前要把开发板用USB连接到电脑上并给开发板供电。）如果能够连接成功，会出现以下信息。
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[Start]

Execute the command:

%ccs_base%/common/uscif/dbgjtag.exe -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]

-----[Print the board config pathname(s)]------------------------------------

C:\Users\chengkai\AppData\Local\.TI\693494126\
    0\0\BrdDat\testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 560/2xx-class product.
This utility will load the program 'bh560v2u.out'.
Loaded FPGA Image: C:\ti\ccsv5\ccs_base\common\uscif\dtc_top.jbc
The library build date was 'Oct  3 2012'.
The library build time was '22:14:17'.
The library package version is '5.0.872.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '5' (0x00000005).
The controller has an insertion length of '0' (0x00000000).
The cable+pod has a version number of '8' (0x00000008).
The cable+pod has a capability number of '7423' (0x00001cff).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the Nano-TBC VHDL.
The link is a 560-class second-generation-560 cable.
The software is configured for Nano-TBC VHDL features.
The controller will be software reset via its registers.
The controller has a logic ONE on its EMU[0] input pin.
The controller has a logic ONE on its EMU[1] input pin.
The controller will use falling-edge timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '2' (0x0002).
The utility logic has not previously detected a power-loss.
The utility logic is not currently detecting a power-loss.
Loaded FPGA Image: C:\ti\ccsv5\ccs_base\common\uscif\dtc_top.jbc

-----[The log-file for the JTAG TCLK output generated from the PLL]----------

  Test  Size   Coord      MHz    Flag  Result       Description
  ~~~~  ~~~~  ~~~~~~~  ~~~~~~~~  ~~~~  ~~~~~~~~~~~  ~~~~~~~~~~~~~~~~~~~
    1   none  - 01 00  500.0kHz   -    similar      isit internal clock
    2   none  - 01 09  570.3kHz   -    similar      isit internal clock
    3    512  - 01 00  500.0kHz   O    good value   measure path length
    4    128  - 01 00  500.0kHz   O    good value   auto step initial
    5    128  - 01 0D  601.6kHz   O    good value   auto step delta
    6    128  - 01 1C  718.8kHz   O    good value   auto step delta
    7    128  - 01 2E  859.4kHz   O    good value   auto step delta
    8    128  + 00 02  1.031MHz   O    good value   auto step delta
    9    128  + 00 0F  1.234MHz   O    good value   auto step delta
   10    128  + 00 1F  1.484MHz   O    good value   auto step delta
   11    128  + 00 32  1.781MHz   O    good value   auto step delta
   12    128  + 01 04  2.125MHz   O    good value   auto step delta
   13    128  + 01 11  2.531MHz   O    good value   auto step delta
   14    128  + 01 21  3.031MHz   O    good value   auto step delta
   15    128  + 01 34  3.625MHz   O    good value   auto step delta
   16    128  + 02 05  4.313MHz   O    good value   auto step delta
   17    128  + 02 13  5.188MHz   O    good value   auto step delta
   18    128  + 02 23  6.188MHz   O    good value   auto step delta
   19    128  + 02 37  7.438MHz   O    good value   auto step delta
   20    128  + 03 07  8.875MHz   O    good value   auto step delta
   21    128  + 03 15  10.63MHz   O    good value   auto step delta
   22    128  + 03 1E  11.75MHz  {O}   good value   auto step delta
   23    512  + 02 3E  7.875MHz   O    good value   auto power initial
   24    512  + 03 0E  9.750MHz   O    good value   auto power delta
   25    512  + 03 16  10.75MHz   O    good value   auto power delta
   26    512  + 03 1A  11.25MHz   O    good value   auto power delta
   27    512  + 03 1C  11.50MHz   O    good value   auto power delta
   28    512  + 03 1D  11.63MHz   O    good value   auto power delta
   29    512  + 03 1D  11.63MHz   O    good value   auto power delta
   30    512  + 03 13  10.38MHz  {O}   good value   auto margin initial

The first internal/external clock test resuts are:
The expect frequency was 500000Hz.
The actual frequency was 499872Hz.
The delta frequency was 128Hz.

The second internal/external clock test resuts are:
The expect frequency was 570312Hz.
The actual frequency was 569214Hz.
The delta frequency was 1098Hz.

In the scan-path tests:
The test length was 16384 bits.
The JTAG IR length was 6 bits.
The JTAG DR length was 1 bits.

The IR/DR scan-path tests used 30 frequencies.
The IR/DR scan-path tests used 500.0kHz as the initial frequency.
The IR/DR scan-path tests used 11.75MHz as the highest frequency.
The IR/DR scan-path tests used 10.38MHz as the final frequency.

-----[Measure the source and frequency of the final JTAG TCLKR input]--------

The frequency of the JTAG TCLKR input is measured as 10.37MHz.

The frequency of the JTAG TCLKR input and TCLKO output signals are similar.
The target system likely uses the TCLKO output from the emulator PLL.

-----[Perform the standard path-length test on the JTAG IR and DR]-----------

This path-length test uses blocks of 512 32-bit words.

The test for the JTAG IR instruction path-length succeeded.
The JTAG IR instruction path-length is 6 bits.

The test for the JTAG DR bypass path-length succeeded.
The JTAG DR bypass path-length is 1 bits.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 512 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG IR Integrity scan-test has succeeded.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 512 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG DR Integrity scan-test has succeeded.

[End]
Step 6：依次选择Advanced -> C66xx_0(此处是选择一个核，选其他的也可以) -> Browse -> Save -> Test Connection。注意：在单击Browse时会弹出一个选择文件的对话框，我们要选择的文件路径为：
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C:\ti\ccsv5\ccs_base\emulation\boards\evmc6670l\gel

这个路径根据自己安装CCS的路径而定。
如果测试通过，会出现下面的信息。
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[Start]

Executethecommand:

%ccs_base%/common/uscif/dbgjtag.exe-f%boarddatafile%-rv-o-Finform,logfile=yes-Spathlength-Sintegrity

[Result]

-----[Printtheboardconfigpathname(s)]------------------------------------

C:\Users\chengkai\AppData\Local\.TI\693494126\
    0\0\BrdDat\testBoard.dat

-----[Printthereset-commandsoftwarelog-file]-----------------------------

Thisutilityhasselecteda560/2xx-classproduct.
Thisutilitywillloadtheprogram'bh560v2u.out'.
LoadedFPGAImage:C:\ti\ccsv5\ccs_base\common\uscif\dtc_top.jbc
Thelibrarybuilddatewas'Oct  3 2012'.
Thelibrarybuildtimewas'22:14:17'.
Thelibrarypackageversionis'5.0.872.0'.
Thelibrarycomponentversionis'35.34.40.0'.
ThecontrollerdoesnotuseaprogrammableFPGA.
Thecontrollerhasaversionnumberof'5'(0x00000005).
Thecontrollerhasaninsertionlengthof'0'(0x00000000).
Thecable+podhasaversionnumberof'8'(0x00000008).
Thecable+podhasacapabilitynumberof'7423'(0x00001cff).
Thisutilitywillattempttoresetthecontroller.
Thisutilityhassuccessfullyresetthecontroller.

-----[Printthereset-commandhardwarelog-file]-----------------------------

Thescan-pathwillberesetbytogglingtheJTAGTRSTsignal.
ThecontrolleristheNano-TBCVHDL.
Thelinkisa560-classsecond-generation-560cable.
ThesoftwareisconfiguredforNano-TBCVHDLfeatures.
Thecontrollerwillbesoftwareresetviaitsregisters.
ThecontrollerhasalogicONEonitsEMU[0]inputpin.
ThecontrollerhasalogicONEonitsEMU[1]inputpin.
Thecontrollerwillusefalling-edgetimingonoutputpins.
Thecontrollercannotcontrolthetimingoninputpins.
Thescan-pathlink-delayhasbeensettoexactly'2'(0x0002).
Theutilitylogichasnotpreviouslydetectedapower-loss.
Theutilitylogicisnotcurrentlydetectingapower-loss.
LoadedFPGAImage:C:\ti\ccsv5\ccs_base\common\uscif\dtc_top.jbc

-----[Thelog-filefortheJTAGTCLKoutputgeneratedfromthePLL]----------

  Test  Size  Coord      MHz    Flag  Result      Description
  ~~~~  ~~~~  ~~~~~~~  ~~~~~~~~  ~~~~  ~~~~~~~~~~~  ~~~~~~~~~~~~~~~~~~~
    1  none  -0100  500.0kHz  -    similar      isitinternalclock
    2  none  -0109  570.3kHz  -    similar      isitinternalclock
    3    512  -0100  500.0kHz  O    goodvalue  measurepathlength
    4    128  -0100  500.0kHz  O    goodvalue  autostepinitial
    5    128  -010D  601.6kHz  O    goodvalue  autostepdelta
    6    128  -011C  718.8kHz  O    goodvalue  autostepdelta
    7    128  -012E  859.4kHz  O    goodvalue  autostepdelta
    8    128  +0002  1.031MHz  O    goodvalue  autostepdelta
    9    128  +000F  1.234MHz  O    goodvalue  autostepdelta
  10    128  +001F  1.484MHz  O    goodvalue  autostepdelta
  11    128  +0032  1.781MHz  O    goodvalue  autostepdelta
  12    128  +0104  2.125MHz  O    goodvalue  autostepdelta
  13    128  +0111  2.531MHz  O    goodvalue  autostepdelta
  14    128  +0121  3.031MHz  O    goodvalue  autostepdelta
  15    128  +0134  3.625MHz  O    goodvalue  autostepdelta
  16    128  +0205  4.313MHz  O    goodvalue  autostepdelta
  17    128  +0213  5.188MHz  O    goodvalue  autostepdelta
  18    128  +0223  6.188MHz  O    goodvalue  autostepdelta
  19    128  +0237  7.438MHz  O    goodvalue  autostepdelta
  20    128  +0307  8.875MHz  O    goodvalue  autostepdelta
  21    128  +0315  10.63MHz  O    goodvalue  autostepdelta
  22    128  +031E  11.75MHz  {O}  goodvalue  autostepdelta
  23    512  +023E  7.875MHz  O    goodvalue  autopowerinitial
  24    512  +030E  9.750MHz  O    goodvalue  autopowerdelta
  25    512  +0316  10.75MHz  O    goodvalue  autopowerdelta
  26    512  +031A  11.25MHz  O    goodvalue  autopowerdelta
  27    512  +031C  11.50MHz  O    goodvalue  autopowerdelta
  28    512  +031D  11.63MHz  O    goodvalue  autopowerdelta
  29    512  +031D  11.63MHz  O    goodvalue  autopowerdelta
  30    512  +0313  10.38MHz  {O}  goodvalue  automargininitial

Thefirstinternal/externalclocktestresutsare:
Theexpectfrequencywas500000Hz.
Theactualfrequencywas499110Hz.
Thedeltafrequencywas890Hz.

Thesecondinternal/externalclocktestresutsare:
Theexpectfrequencywas570312Hz.
Theactualfrequencywas569214Hz.
Thedeltafrequencywas1098Hz.

Inthescan-pathtests:
Thetestlengthwas16384bits.
TheJTAGIRlengthwas6bits.
TheJTAGDRlengthwas1bits.

TheIR/DRscan-pathtestsused30frequencies.
TheIR/DRscan-pathtestsused500.0kHzastheinitialfrequency.
TheIR/DRscan-pathtestsused11.75MHzasthehighestfrequency.
TheIR/DRscan-pathtestsused10.38MHzasthefinalfrequency.

-----[MeasurethesourceandfrequencyofthefinalJTAGTCLKRinput]--------

ThefrequencyoftheJTAGTCLKRinputismeasuredas10.37MHz.

ThefrequencyoftheJTAGTCLKRinputandTCLKOoutputsignalsaresimilar.
ThetargetsystemlikelyusestheTCLKOoutputfromtheemulatorPLL.

-----[Performthestandardpath-lengthtestontheJTAGIRandDR]-----------

Thispath-lengthtestusesblocksof51232-bitwords.

ThetestfortheJTAGIRinstructionpath-lengthsucceeded.
TheJTAGIRinstructionpath-lengthis6bits.

ThetestfortheJTAGDRbypasspath-lengthsucceeded.
TheJTAGDRbypasspath-lengthis1bits.

-----[PerformtheIntegrityscan-testontheJTAGIR]------------------------

Thistestwilluseblocksof51232-bitwords.
Thistestwillbeappliedjustonce.

Doatestusing0xFFFFFFFF.
Scantests:1,skipped:0,failed:0
Doatestusing0x00000000.
Scantests:2,skipped:0,failed:0
Doatestusing0xFE03E0E2.
Scantests:3,skipped:0,failed:0
Doatestusing0x01FC1F1D.
Scantests:4,skipped:0,failed:0
Doatestusing0x5533CCAA.
Scantests:5,skipped:0,failed:0
Doatestusing0xAACC3355.
Scantests:6,skipped:0,failed:0
Allofthevalueswerescannedcorrectly.

TheJTAGIRIntegrityscan-testhassucceeded.

-----[PerformtheIntegrityscan-testontheJTAGDR]------------------------

Thistestwilluseblocksof51232-bitwords.
Thistestwillbeappliedjustonce.

Doatestusing0xFFFFFFFF.
Scantests:1,skipped:0,failed:0
Doatestusing0x00000000.
Scantests:2,skipped:0,failed:0
Doatestusing0xFE03E0E2.
Scantests:3,skipped:0,failed:0
Doatestusing0x01FC1F1D.
Scantests:4,skipped:0,failed:0
Doatestusing0x5533CCAA.
Scantests:5,skipped:0,failed:0
Doatestusing0xAACC3355.
Scantests:6,skipped:0,failed:0
Allofthevalueswerescannedcorrectly.

TheJTAGDRIntegrityscan-testhassucceeded.

[End]

这样我们就创建好了Target Configuration。

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